■ Number of Test PIN: 24
■ Frequency: 20Hz-200kHz, 15025 points
■ Signal Level: 10mV-2Vrms, 100μA—20mArms
20mV-1Vrms, 200μA—10mArms
■ Test Speed: max. 40ms
■ 4.3 inch TFT LCD Display
■ Brand new interface design
■ built-in 0 - ± 5V/50mA bias source
■ TH2832XA: LCR + transformer test system
TH2832XB: transformer test system
TH2832XC: transformer test system
■ Discrete passive component (L, C, R) multipass scan test
■ Switch transformer scan test
■ Network transformer scan test
■ Relay drive coil, contact resistance multi-channle scan test
■ Multi-channel DCR scan test
■ Singel parameter loop test
■ Scan fixture relay action times review
■ Flexible deviation deduction method
■ Self-test scanning fixture relays
■ Storage: Internal: 100 groups of settings file to save
U disk: large capacity of configuration files, CSV
format test data, and GIF format images
■ Firmware update through U disk
■ Optional PC-level instrument test setup file programming
capability
■ Parameter setting file is compatibe with TH 2829x-24
■ RS-232, USB DEVICE interface
■ Work with TH1831 24-pin transformer scanning fixture
- Brief Introduction
- Application
- Technical Parameter
Model TH2832XA TH2832XB TH2832XC Number of Test Pin 24 24 12 Test Signal Frequency 20Hz-200kHz, 15025 points in total. Display 4.3 inch TFT LCD 272*480 Transformer Test Parameter Turn ratio, turs, phase, L, C, Lk, Q, ACR, DCR, Balance, Pin short. LCR Test Parameter |Z|,Y|, C, L, X, B, R, G, D, Q, θ, DCR, Turn-ratio, Phase, Lk. No LCR function Basic Accuracy LCRZ 0.1% ------ DCR, Turn ratio 0.5% Signal Source Output Impedance 30Ω, 100Ω selectable. Test Speed (≥10 kHz) Fast: 40ms, Med: 125ms, Slow: 370ms. AC Signal Level 10mV – 2Vrms, 100μA – 20mArms. DC Bias Voltage Source 0V – ± 5V, 0mA –±50mA. Comparator Function 10-bin sorting, PASS/FAIL indicator, count function Memory 100 groups of LCRZ setting file,100 groups of transformer scan set file, 10 groups of gif file.
- Accessary
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- Data download
| Name of data | Download Link |
| Specification | Download |